Statistics
Publications
1
Citations
39
H-Index
1
Active since
2007
Affiliations
Yen-Wei Cheng is an author at Taiwan Semiconductor Manufacturing Company (Taiwan) specializing in defect detection, engineering, and design for testability.
Publications per year
2007–2007
1
1
Faster defect localization in nanometer technology based on defective cell diagnosis
Manish Sharma, Wu-Tung Cheng, Ting-Pu Tai et al. · 2007 · 39 citations
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