Seizo Morita Seizo Morita

Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope

Hitoshi Ueyama, Yasuhiro Sugawara, Seizo Morita Seizo Morita · Japanese Journal of Applied Physics · 1995 · 147 citations

Engineering, Microscopy, Electron Microscopy +17

Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy

Takayuki Uchihashi, Nami Choi Nami Choi, Masato Tanigawa et al. · Japanese Journal of Applied Physics · 2000 · 57 citations

Engineering, Microscopy, Carbon Nanotechnology +26

Atomic Resolution Imaging on Si(100)2×1 and Si(100)2×1:H Surfaces with Noncontact Atomic Force Microscopy

Kousuke Yokoyama, Taketoshi Ochi, Akira Yoshimoto Akira Yoshimoto et al. · Japanese Journal of Applied Physics · 2000 · 44 citations

Engineering, Microscopy, Chemistry +21

Fluctuation in Two-Dimensional Stick-Slip Phenomenon Observed with Two-Dimensional Frictional Force Microscope

Satoru Fujisawa, Eigo Kishi, Yasuhiro Sugawara Yasuhiro Sugawara et al. · Japanese Journal of Applied Physics · 1994 · 37 citations

Engineering, Mechanical Engineering, Lateral Force Microscope +19

Scanning Force/Tunneling Microscopy as a Novel Technique for the Study of Nanometer-Scale Dielectric Breakdown of Silicon Oxide Layer

Yoshinobu Fukano, Yasuhiro Sugawara, Yoshiki Yamanishi et al. · Japanese Journal of Applied Physics · 1993 · 27 citations

Engineering, Microscopy, Silicon Oxide Layer +21