Saumil Shah

Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance

Ashish Srivastava, Saumil Shah, Kanak Agarwal et al. · 2005 · 88 citations

Engineering, Computer Engineering, Electrical Engineering +17

Variability in nanometer CMOS: Impact, analysis, and minimization

Dennis Sylvester, Kanak Agarwal, Saumil Shah · Integration · 2007 · 66 citations

Engineering, Computer Engineering, Electrical Engineering +12

Modeling of non-uniform device geometries for post-lithography circuit analysis

Puneet Gupta, Andrew B. Kahng, Young‐Min Kim et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2006 · 47 citations

Engineering, Computer Engineering, Electrical Engineering +17

Lithography simulation-based full-chip design analyses

Puneet Gupta, Andrew B. Kahng, Sam Nakagawa et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2006 · 30 citations

Engineering, Computer Engineering, Design Optimization +16

Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence

Vineeth Veetil, Dennis Sylvester, David Blaauw et al. · 2009 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +16