Concepedia

G. Ryan

GR

Statistics

Publications

2

Citations

64

H-Index

2

Active since

1998

Affiliations

Texas Instruments (United States)(Current)

G. Ryan is an author at Texas Instruments (United States) specializing in materials science, metallic materials, and electronic materials.

Publications per year

1998–2002

2

Publications

2

Effects of probe damage on wire bond integrity

G. B. Hotchkiss, G. Ryan, W. Subido et al. · 2002 · 37 citations

, , +16

Elimination of bond-pad damage through structural reinforcement of intermetal dielectrics

Mukesh Saran, Robert G. Cox, C. Wayne Martin et al. · 1998 · 27 citations

, , +15

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