Seung Hoon Tong

A Regularized Singular Value Decomposition-Based Approach for Failure Pattern Classification on Fail Bit Map in a DRAM Wafer

Byunghoon Kim, Young‐Seon Jeong, Seung Hoon Tong et al. · IEEE Transactions on Semiconductor Manufacturing · 2015 · 35 citations

Failure Pattern Classification, Fault Diagnosis, Engineering +21

A generalised uncertain decision tree for defect classification of multiple wafer maps

Byunghoon Kim, Young-Seon Jeong, Seung Hoon Tong et al. · International Journal of Production Research · 2019 · 23 citations

Fault Diagnosis, Engineering, Machine Learning +20

Step-Down Spatial Randomness Test for Detecting Abnormalities in DRAM Wafers with Multiple Spatial Maps

Byunghoon Kim, Young‐Seon Jeong, Seung Hoon Tong et al. · IEEE Transactions on Semiconductor Manufacturing · 2015 · 18 citations

Hardware Security, Engineering, Hardware Reliability +13

System Informatics: From Methodology to Applications

Kang Zhao, Yao Xie, Kwok‐Leung Tsui et al. · IEEE Intelligent Systems · 2015 · 11 citations

Engineering, Business Intelligence, Software Engineering +20

Integrated Variable Importance Assessment in Multi-Stage Processes

Gianluca Gazzola, Jeongsub Choi, Doh‐Soon Kwak et al. · IEEE Transactions on Semiconductor Manufacturing · 2018 · 11 citations

Engineering, Industrial Engineering, Production Management +17