Statistics
Publications
2
Citations
171
H-Index
2
Active since
1998
Affiliations
IIT@MIT(Current)
H. Le is an author at IIT@MIT specializing in electrical engineering, engineering, and device reliability.
Publications per year
1998–2006
2
2
Assessing circuit-level hot-carrier reliability
Wenjie Jiang, H. Le, J.E. Chung et al. · 1998 · 18 citations
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