J. Portillo

Orientation and phase mapping in the transmission electron microscope using precession‐assisted diffraction spot recognition: state‐of‐the‐art results

Désirée Viladot, M. Véron, Mauro Gemmi et al. · Journal of Microscopy · 2013 · 155 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Precession technique and electron diffractometry as new tools for crystal structure analysis and chemical bonding determination

Kiril Kuligin, Stavros Nicolopoulos, M. Nickolskiy et al. · Ultramicroscopy · 2006 · 93 citations

Natural Sciences, Chemistry, Materials Science +17

Fast-ADT: A fast and automated electron diffraction tomography setup for structure determination and refinement

Sergi Plana‐Ruiz, Yaşar Krysiak, J. Portillo et al. · Ultramicroscopy · 2020 · 80 citations

Natural Sciences, Chemistry, Materials Science +12

AES and XPS analysis of the interaction of Ti with Si and SiO2 during RTA

H. Bender, W.D. Chen, J. Portillo et al. · Applied Surface Science · 1989 · 68 citations

Natural Sciences, Materials Engineering, Materials Science +8

A new approach for 3D reconstruction from bright field TEM imaging: Beam precession assisted electron tomography

José Manuel Rebled, Lluís Yedra, Sònia Estradé et al. · Ultramicroscopy · 2011 · 40 citations

Engineering, Biomedical Engineering, Biomedical Imaging +14