Statistics
Publications
1
Citations
24
H-Index
1
Active since
1994
Affiliations
C. Jassaud is an author at Centre National de la Recherche Scientifique specializing in metal-oxide-semiconductor field-effect transistors, engineering, and source-drain leakage.
Publications per year
1994–1994
1
1
High temperature silicon carbide MOSFETs with verylow drain leakage current
T. Billon, T. Ouisse, P. Lassagne et al. · Electronics Letters · 1994 · 24 citations
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