Bai Hong

Experimental evidence of ballistic transport in cylindrical gate-all-around twin silicon nanowire metal-oxide-semiconductor field-effect transistors

Keun Hwi Cho, Kyongmin Yeo, Yun Young Yeoh et al. · Applied Physics Letters · 2008 · 85 citations

Device Modeling, Electrical Engineering, Ballistic Transport +14

Single crystalline aluminum nanowires with ideal resistivity

Moon‐Sung Kang, B.-S. Kim, Bai Hong et al. · Scripta Materialia · 2010 · 30 citations

Materials Science, One-dimensional Material, Engineering +4

Subthreshold Degradation of Gate-all-Around Silicon Nanowire Field-Effect Transistors: Effect of Interface Trap Charge

Bai Hong, Nam Ung Cho, Su Jung Lee et al. · IEEE Electron Device Letters · 2011 · 23 citations

Engineering, Integrated Circuits, Interface Trap Charge +18

Temperature Dependent Study of Random Telegraph Noise in Gate-All-Around PMOS Silicon Nanowire Field-Effect Transistors

Bai Hong, Lynn Choi, Yoonhyuk Jung et al. · IEEE Transactions on Nanotechnology · 2010 · 17 citations

Gaa Pmos Snwfets, Electrical Engineering, Engineering +14

Quantitative Extraction of Temperature-Dependent Barrier Height and Channel Resistance of a-SIZO/OMO and a-SIZO/IZO Thin-Film Transistors

Keun Heo, Bai Hong, Eunha Lee et al. · IEEE Electron Device Letters · 2013 · 11 citations

Engineering, Thin Film Process Technology, Silicon On Insulator +17