Wen-Pin Lu

Numerical Simulation of Bottom Oxide Thickness Effect on Charge Retention in SONOS Flash Memory Cells

Shaw-Hung Gu, Chih-Wei Hsu, Tahui Wang et al. · IEEE Transactions on Electron Devices · 2007 · 65 citations

Engineering, Electrical Engineering, Materials Science +17

Corrosion and passivation behavior of Ti-6Al-4V surfaces treated with high-energy pulsed laser: A comparative study of cast and 3D-printed specimens in a NaCl solution

Wen-Pin Lu, Yujing Liu, Xiang Wu et al. · Surface and Coatings Technology · 2023 · 63 citations

Natural Sciences, Materials Engineering, Materials Science +17

Extraction of nitride trap density from stress induced leakage current in silicon-oxide-nitride-oxide-silicon flash memory

Shaw-Hung Gu, Tahui Wang, Wen-Pin Lu et al. · Applied Physics Letters · 2006 · 22 citations

Engineering, Electrical Engineering, Materials Science +17

Characterization of programmed charge lateral distribution in a two-bit storage nitride flash memory cell by using a charge-pumping technique

Shaw-Hung Gu, Tahui Wang, Wen-Pin Lu et al. · IEEE Transactions on Electron Devices · 2005 · 11 citations

Engineering, Electrical Engineering, Materials Science +16

A 4b/cell NROM 1Gb Data-Storage Memory

A. Lavan, Ran Sahar, O. Dadashev et al. · 2006 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +15