Ruthan Lewis

Evaluation of a cesium primary ion source on an ion microprobe mass spectrometer

Peter Williams, Ruthan Lewis, C. A. Evans et al. · Analytical Chemistry · 1977 · 82 citations

Natural Sciences, Chemistry, Analytical Chemistry +7

Secondary ion emission for surface and in-depth analysis of tantalum thin films

J.M. Morabito, Ruthan Lewis · Analytical Chemistry · 1973 · 59 citations

Natural Sciences, Chemistry, Materials Science +9

Primary oxygen ion implantation effects on depth profiles by secondary ion emission mass spectrometry

Ruthan Lewis, J.M. Morabito, J. C. C. Tsai · Applied Physics Letters · 1973 · 55 citations

Natural Sciences, Chemistry, Materials Science +15

Boron diffusion in silicon at high concentrations

W. A. Orr Arienzo, R. Glang, R. F. Lever et al. · Journal of Applied Physics · 1988 · 41 citations

Engineering, Materials Engineering, Materials Science +17

Effects of ambient gas on the diffusion of copper through thin chromium films and of nickel through thin gold films

Sumit Kumar Ray, Ruthan Lewis · Thin Solid Films · 1985 · 18 citations

Natural Sciences, Materials Engineering, Materials Science +11