A. Touhami

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Active since

1997

Affiliations

University of Hassan II Casablanca(Current)

A. Touhami is an author at University of Hassan II Casablanca specializing in gate-induced drain leakage, semiconductor reliability, and device characterization.

ORCID

Publications per year

1997–2005

Publications

Modelling of gate-induced drain leakage in relation to technological parameters and temperature

A. Bouhdada, Soumia Bakkali, A. Touhami · Microelectronics Reliability · 1997 · 29 citations

Engineering, Computer Engineering, Electrical Engineering +14

Impact of interface traps on gate-induced drain leakage current in<i>n</i>-type metal oxide semiconductor field effect transistor

A. Touhami, A. Bouhdada · International Journal of Electronics · 2005 · 10 citations

Engineering, Electrical Engineering, Microelectronics +16

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