Concepedia
Statistics
Publications
3
Citations
56
H-Index
Active since
2015
Affiliations
IMEC(Current)
SK Group (South Korea)
Yun-Hyuck Ji is an author at IMEC specializing in engineering, device scaling, and microelectronics.
Publications per year
2015–2020
Gate-first high-k/metal gate DRAM technology for low power and high performance products
Minchul Sung, Se‐Aug Jang, Hyunjin Lee et al. · 2015 · 27 citations
Engineering, Electrical Engineering, Materials Science +17
Overview of Bias Temperature Instability in Scaled DRAM Logic for Memory Transistors
Barry O’Sullivan, R. Ritzenthaler, E. Dentoni Litta et al. · IEEE Transactions on Device and Materials Reliability · 2020 · 16 citations
Engineering, Computer Engineering, Electrical Engineering +17
Gate stack engineering to enhance high-κ/metal gate reliability for DRAM I/O applications
Barry O’Sullivan, R. Ritzenthaler, Eddy Simoen et al. · 2017 · 13 citations
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