Statistics
Publications
28
Citations
1.4K
H-Index
21
Active since
1982
Affiliations
M. Schulz is an author at Friedrich-Alexander-Universität Erlangen-Nürnberg specializing in materials science, semiconductor devices, and semiconductor materials.
Publications per year
1982–2000
28
28
Fluctuations of the Au-Si(100) Schottky barrier height
Herbert Palm, M. Arbes, M. Schulz · Physical Review Letters · 1993 · 132 citations
Individual defects at the Si:SiO<sub>2</sub>interface
M. J. Kirton, Michael J. Uren, S. Collins et al. · Semiconductor Science and Technology · 1989 · 117 citations
Interface states at the SiO2-Si interface
M. Schulz · Surface Science · 1983 · 113 citations
Oxygen diffusion through thin Pt films on Si(100)
R. Schmiedl, V. Demuth, P. Lahnor et al. · Applied Physics A · 1996 · 87 citations
Natural Sciences, Materials Engineering, Materials Science +14
1–5 of 28