Thomas M. Moore - Concepedia

Author

Thomas M. Moore

Also Known As

Moore, T. M., Moore, Thomas M., T M Moore, T Moore, T. M. Moore, T. Moore, T.M. Moore, THOMAS M. MOORE, Thomas M Moore, Thomas M. Moore

Publications

1.8K

Citations

H-Index

Concepts

All Affiliations

Texas Instruments (United States)University of Tennessee at Knoxville Oak Ridge National Laboratory University of South Carolina University of South Carolina Sumter

About

Thomas M. Moore is an author at Texas Instruments (United States) specializing in engineering, materials science, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	14	1.3K
2	Applied Physics	8	8	1.2K
3	Electrical Engineering	7	7	154
4	Medicine	1	1	11
5	Biomedical Engineering	1	1	11

Thomas M. Moore

Publications

1.6K

Citations

H-Index

Page 1

	Year	Citations
Observation of discrete electronic states in a zero-dimensional semiconductor nanostructure Mark A. Reed, John N. Randall, Rahul Aggarwal, Physical Review Letters SemiconductorsOne-dimensional MaterialEngineeringQuantum ComputingPhysics	1988	1.1K
Cobalt-Catalyzed Asymmetric Olefin Aziridination with Diphenylphosphoryl Azide Jess E. Jones, Joshua V. Ruppel, Guangyao Gao, The Journal of Organic Chemistry	2008	133
Capillary fluid exchange. A. E. Taylor, Thomas M. Moore AJP Advances in Physiology Education Fluid MechanicsPhysiologyCapillarity PhenomenonCapillary Fluid ExchangeCapillary Network	1999	41
Microstructural characterization of patterned gallium arsenide grown on 〈001〉 silicon substrates R. J. Matyi, H. Shichijo, Thomas M. Moore, Applied Physics Letters EngineeringSemiconductor NanostructuresSemiconductorsPatterned Gaas GrownOxide Mask	1987	38
The impact of delamination on stress-induced and contamination-related failure in surface mount ICs Thomas M. Moore, S.J. Kelsall EngineeringFood PackagingTemperature-cycle EvaluationDamage MechanismAdvanced Packaging (Semiconductors)	1992	35
Microstructure fabrication and transport through quantum dots John N. Randall, Mark A. Reed, Thomas M. Moore, Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena EngineeringOptoelectronic DevicesLateral QuantizationSemiconductor NanostructuresTunneling Microscopy	1988	35
Laser-Assisted Focused He<sup>+</sup> Ion Beam Induced Etching with and without XeF<sub>2</sub> Gas Assist Michael G. Stanford, Kyle Mahady, Brett B. Lewis, ACS Applied Materials & Interfaces	2016	35
Continuous Wave Resonant Photon Stimulated Electron Energy-Gain and Electron Energy-Loss Spectroscopy of Individual Plasmonic Nanoparticles Chenze Liu, Yueying Wu, Zhongwei Hu, ACS Photonics	2019	34
Exploring Photothermal Pathways via <i>in Situ</i> Laser Heating in the Transmission Electron Microscope: Recrystallization, Grain Growth, Phase Separation, and Dewetting in Ag<sub>0.5</sub>Ni<sub>0.5</sub> Thin Films Yueying Wu, Chenze Liu, Thomas M. Moore, Microscopy and Microanalysis	2018	28
Correlation of surface mount plastic package reliability testing to nondestructive inspection by scanning acoustic microscopy Thomas M. Moore, Robert G. McKenna, S.J. Kelsall EngineeringRepair TechniquesReliability EngineeringNondestructive InspectionElectronic Packaging	2002	23

Page 1