Jong Seung Hwang

Interface Trap Density of Gate-All-Around Silicon Nanowire Field-Effect Transistors With TiN Gate: Extraction and Compact Model

Faraz Najam, Yun Seop Yu, Keun Hwi Cho et al. · IEEE Transactions on Electron Devices · 2013 · 20 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +15

Reflection color tuning of a metal–insulator–metal cavity structure using arc plasma deposition of gold nanoparticles

Yun Hee Kim, M. A. Rahman, Jong Seung Hwang et al. · Applied Surface Science · 2021 · 20 citations

Materials Science, Plasmonics, Engineering +8

Microwave Characterization of a Single Wall Carbon Nanotube Bundle

Myung Gil Kang, Ju Lim, Su Heon Hong et al. · Japanese Journal of Applied Physics · 2008 · 16 citations

Engineering, Bare Cpw, Electromagnetic Compatibility +16

Electrical Transport Properties of Au-Doped Deoxyribonucleic Acid Molecules

Jong Seung Hwang, Su Heon Hong, Hyung Kwon Kim et al. · Japanese Journal of Applied Physics · 2005 · 10 citations

Engineering, Au Atoms, Molecular Biology +19