Statistics
Publications
6
Citations
298
H-Index
6
Active since
2005
David Reilly is an author at University of Missouri specializing in engineering, microelectronics, and electrical engineering.
Publications per year
2005–2025
6
6
Interferometric single-shot parity measurement in InAs–Al hybrid devices
Morteza Aghaee, Alejandro Alcaraz Ramirez, Zulfi Alam et al. · Nature · 2025 · 127 citations · Full text
Jacob McFarland, David Reilly, Wolfgang Black et al. · Physical Review E · 2015 · 43 citations · Full text
Ion implanted Si:P double dot with gate tunable interdot coupling
Victor Chan, T. M. Buehler, A. J. Ferguson et al. · Journal of Applied Physics · 2006 · 20 citations · Full text
1–5 of 6