Concepedia

Guilherme Cardoso Medeiros

GC

9

Publications

272

Citations

9

H-Index

2016

Active since

Affiliations

Delft University of Technology(Current)

Pontifícia Universidade Católica do Rio Grande do Sul

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Aix-Marseille Université

Guilherme Cardoso Medeiros is an author at Delft University of Technology specializing in engineering, microelectronics, and electrical engineering.

Top concepts

EngineeringMicroelectronicsComputer EngineeringElectrical EngineeringComputer ArchitectureSoftware TestingHardware SecurityReliability EngineeringDesign For TestingDefect Tolerance

Publications per year

2016–2022

9

Publications

9

Device-Aware Test: A New Test Approach Towards DPPB Level

Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros et al. · 2019 · 66 citations

Engineering, Device-aware Test, Emerging Memory Technology +18

Defects, Fault Modeling, and Test Development Framework for RRAMs

Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu et al. · ACM Journal on Emerging Technologies in Computing Systems · 2022 · 39 citations · Full text

Resistive Ram, Engineering, Mem Testing +19

Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing

Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros et al. · 2019 · 35 citations

Hardware Security, Electrical Engineering, Reliability Engineering +12

Analyzing the behavior of FinFET SRAMs with resistive defects

T. Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros et al. · 2017 · 31 citations

Hardware Security, Defect Tolerance, Electrical Engineering +13

Defect and Fault Modeling Framework for STT-MRAM Testing

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil et al. · IEEE Transactions on Emerging Topics in Computing · 2019 · 31 citations · Full text

Hardware Security, Defect Tolerance, Electrical Engineering +14

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