Guilherme Cardoso Medeiros

Author

Also Known As

De Medeiros, Gustavo Quintas Glasner, G Medeiros, G. C. Medeiros, G. Cardoso Medeiros, G. De Medeiros, G. Medeiros, G.C. Medeiros, GILVANDRO CSAR SANTOS DE MEDEIROS, GILVANDRO CÉSAR SANTOS DE MEDEIROS, Gabriel Sanguanini de Medeiros

Publications

338

Citations

H-Index

Concepts

All Affiliations

Delft University of Technology Pontifícia Universidade Católica do Rio Grande do Sul IMEC Institut des Matériaux, de Microélectronique et des Nanosciences de Provence Aix-Marseille Université

About

Guilherme Cardoso Medeiros is an author at Delft University of Technology specializing in engineering, microelectronics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	9	9	272
2	Computer Engineering	8	8	253
3	Electrical Engineering	8	8	259
4	Computer Science	2	2	27
5	Physics	2	2	32

Guilherme Cardoso Medeiros

Publications

272

Citations

H-Index

Page 1

	Year	Citations
Device-Aware Test: A New Test Approach Towards DPPB Level Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, EngineeringDevice-aware TestEmerging Memory TechnologyMem TestingComputer Architecture	2019	66
Defects, Fault Modeling, and Test Development Framework for RRAMs Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, ACM Journal on Emerging Technologies in Computing Systems Resistive RamEngineeringMem TestingComputer ArchitectureSoftware Engineering	2022	39
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Hardware SecurityElectrical EngineeringReliability EngineeringEngineeringHardware Reliability	2019	35
Analyzing the behavior of FinFET SRAMs with resistive defects T. Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Hardware SecurityDefect ToleranceElectrical EngineeringEngineeringVlsi Design	2017	31
Defect and Fault Modeling Framework for STT-MRAM Testing Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, IEEE Transactions on Emerging Topics in Computing Hardware SecurityDefect ToleranceElectrical EngineeringReliability EngineeringEngineering	2019	31
Intermittent Undefined State Fault in RRAMs Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, State FaultElectrical EngineeringReliability EngineeringEngineeringMemory Architecture	2021	24
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits Maksim Jenihhin, Giovanni Squillero, T. Copetti, Journal of Electronic Testing Nbti-critical Logic PathsElectrical EngineeringEngineeringCircuit DesignPhysics	2016	19
Hard-to-Detect Fault Analysis in FinFET SRAMs Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, IEEE Transactions on Very Large Scale Integration (VLSI) Systems EngineeringMem TestingParametric Test SolutionsFinfet SramsComputer Architecture	2021	14
DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, EngineeringMem TestingFinfet SramsComputer ArchitectureHardware Security	2019	13

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