Li-Hua Dai

An Analytical Study of the Effect of Total Ionizing Dose on Body Current in 130-nm PDSOI I/O nMOSFETs

Xin Xie, Huilong Zhu, Mengying Zhang et al. · IEEE Transactions on Nuclear Science · 2019 · 20 citations

Engineering, Electrical Engineering, Radiation Dosimetry +13

A novel highly reliable and low-power radiation hardened SRAM bit-cell design

Dianpeng Lin, Yiran Xu, Xiaonian Liu et al. · IEICE Electronics Express · 2018 · 18 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs

Li-Hua Dai, Xiaonian Liu, Mengying Zhang et al. · Microelectronics Reliability · 2017 · 16 citations

Engineering, Electrical Engineering, Microelectronics +15

Single Event Upset Sensitivity of D-Flip Flop: Comparison of PDSOI With Bulk Si at 130 nm Technology Node

Leqing Zhang, Jialing Xu, Shuang Fan et al. · IEEE Transactions on Nuclear Science · 2016 · 11 citations

Engineering, Computer Engineering, Electrical Engineering +17