Dongchao Xu

Thermal boundary resistance correlated with strain energy in individual Si film-wafer twist boundaries

Dongchao Xu, Riley Hanus, Yue Xiao et al. · Materials Today Physics · 2018 · 36 citations

Wafer Scale Processing, Engineering, Physics +8

Thermal Studies of Nanoporous Si Films with Pitches on the Order of 100 nm —Comparison between Different Pore-Drilling Techniques

Qing Hao, Dongchao Xu, Hongbo Zhao et al. · Scientific Reports · 2018 · 27 citations · Full text

Detecting the major charge-carrier scattering mechanism in graphene antidot lattices

Dongchao Xu, Shuang Tang, Xu Du et al. · Carbon · 2018 · 21 citations

Graphene Nanomeshes, Graphene Quantum Dot, Engineering +8

Thermal studies of individual Si/Ge heterojunctions — The influence of the alloy layer on the heterojunction

Sien Wang, Dongchao Xu, Ramya Gurunathan et al. · Journal of Materiomics · 2020 · 20 citations · Full text

Largely reduced cross-plane thermal conductivity of nanoporous In0.1Ga0.9N thin films directly grown by metal organic chemical vapor deposition

Dongchao Xu, Quan Wang, Xuewang Wu et al. · Frontiers in Energy · 2017 · 19 citations

Materials Science, Engineering, Nanotechnology +8