J. Lee

Hot electron effects on efficiency degradation in InGaN light emitting diodes and designs to mitigate them

X. Ni, X. Li, J. Lee et al. · Journal of Applied Physics · 2010 · 59 citations

Engineering, Electrical Engineering, Materials Science +17

Ultrahigh vacuum–scanning tunneling microscopy nanofabrication and hydrogen/deuterium desorption from silicon surfaces: implications for complementary metal oxide semiconductor technology

Joseph W. Lyding, K. Hess, G. C. Abeln et al. · Applied Surface Science · 1998 · 34 citations

Natural Sciences, Materials Engineering, Materials Science +17

High-performance chip reliability from short-time-tests-statistical models for optical interconnect and HCI/TDDB/NBTI deep-submicron transistor failures

A. Haggag, William E. McMahon, K. Hess et al. · 2002 · 33 citations

Engineering, Computer Engineering, Electrical Engineering +17

Simulation of Si-SiO/sub 2/ defect generation in CMOS chips: from atomistic structure to chip failure rates

K. Hess, A. Haggag, William E. McMahon et al. · 2002 · 30 citations

Engineering, Electrical Engineering, Materials Science +17

Variable temperature study of the passivation of dangling bonds at Si(100)-2×1 reconstructed surfaces with H and D

Mark C. Hersam, Nathan P. Guisinger, J. Lee et al. · Applied Physics Letters · 2002 · 28 citations

Natural Sciences, Materials Engineering, Materials Science +17