Palkesh Jain

Product drift from NBTI: Guardbanding, circuit and statistical effects

Anand Krishnan, Frank Cano, C. Chancellor et al. · 2010 · 42 citations

Engineering, Product Drift, Stochastic Analysis +19

Accurate Current Estimation for Interconnect Reliability Analysis

Palkesh Jain, Ankit Jain · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2011 · 27 citations

Engineering, Power Electronic Systems, Accurate Current Estimation +16

New electromigration validation: Via Node Vector Method

Young-Joon Park, Palkesh Jain, S. Krishnan · 2010 · 25 citations

Engineering, Computer Architecture, Verification And Validation +19

Cell-Internal Electromigration: Analysis and Pin Placement Based Optimization

Gracieli Posser, Vivek Mishra, Palkesh Jain et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2015 · 16 citations

Engineering, Biomedical Engineering, Integrated Circuits +19

A systematic approach for analyzing and optimizing cell-internal signal electromigration

Gracieli Posser, Vivek Mishra, Palkesh Jain et al. · International Conference on Computer Aided Design · 2014 · 14 citations

Engineering, Biomedical Engineering, Interconnect (Integrated Circuits) +17