Yong-Tian Hou

Raman investigation with excitation of various wavelength lasers on porous silicon

Shulin Zhang, Yong-Tian Hou, Kuoksan Ho et al. · Journal of Applied Physics · 1992 · 54 citations

Materials Science, Photonics, Raman Investigation +14

Investigation of hole-tunneling current through ultrathin oxynitride/oxide stack gate dielectrics in p-MOSFETs

H.Y. Yu, Yong-Tian Hou, Mingfu Li et al. · IEEE Transactions on Electron Devices · 2002 · 42 citations

Materials Science, Electrical Engineering, Dielectric Thickness +11

Infrared reflectance of GaN films grown on Si(001) substrates

Xiong Zhang, Yong-Tian Hou, Zhe Chuan Feng et al. · Journal of Applied Physics · 2001 · 30 citations

Materials Engineering, Materials Science, Electrical Engineering +12

Steplike behavior of photoluminescence peak energy and formation of <i>p</i>-type porous silicon

Shulin Zhang, Kuoksan Ho, Yong-Tian Hou et al. · Applied Physics Letters · 1993 · 21 citations

Materials Science, Steplike Behavior, Semiconductor Technology +14

Spatial and energetic distribution of border traps in the dual-layer HfO2∕SiO2 high-k gate stack by low-frequency capacitance-voltage measurement

Wei-Hao Wu, Bing‐Yue Tsui, Mao-Chieh Chen et al. · Applied Physics Letters · 2006 · 20 citations

Engineering, Low-frequency Capacitance-voltage Measurement, Border Traps +17