Weifeng Sun

Review on the Reliability Mechanisms of SiC Power MOSFETs: A Comparison Between Planar-Gate and Trench-Gate Structures

Jiaxing Wei, Zhaoxiang Wei, Hao Fu et al. · IEEE Transactions on Power Electronics · 2023 · 87 citations

Engineering, Sic Power Mosfets, Reliability Mechanisms +18

Repetitive Unclamped-Inductive-Switching-Induced Electrical Parameters Degradations and Simulation Optimizations for 4H-SiC MOSFETs

Siyang Liu, Chunde Gu, Jiaxing Wei et al. · IEEE Transactions on Electron Devices · 2016 · 77 citations

Electrical Engineering, 4H-sic Mosfets, Engineering +14

An Improved Quadrangle Control Method for Four-Switch Buck-Boost Converter With Reduced Loss and Decoupling Strategy

Qi Liu, Qinsong Qian, Zheng Min et al. · IEEE Transactions on Power Electronics · 2021 · 77 citations

Electrical Engineering, Fsbb Prototype, Engineering +11

Comprehensive Analysis of Electrical Parameters Degradations for SiC Power MOSFETs Under Repetitive Short-Circuit Stress

Jiaxing Wei, Siyang Liu, Lanlan Yang et al. · IEEE Transactions on Electron Devices · 2018 · 71 citations

Engineering, Sic Power Mosfets, Power Electronics +18

Fast implementation of generalised Radon-Fourier transform for manoeuvring radar target detection

Lichang Qian, Jia Xu, X.-G. Xia et al. · Electronics Letters · 2012 · 68 citations