Kota Takahashi

Re-Examination of Vth Window and Reliability in HfO2 FeFET Based on the Direct Extraction of Spontaneous Polarization and Trap Charge during Memory Operation

Reika Ichihara, Kunifumi Suzuki, Haruka Kusai et al. · 2020 · 77 citations

Engineering, Electrical Engineering, Materials Science +17

Accurate Picture of Cycling Degradation in HfO₂-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis

Reika Ichihara, Y. Higashi, Kunifumi Suzuki et al. · 2021 IEEE International Electron Devices Meeting (IEDM) · 2021 · 37 citations

Engineering, Electrical Engineering, Physics +15

HfO₂-based FeFET and FTJ for Ferroelectric-Memory Centric 3D LSI towards Low-Power and High-Density Storage and AI Applications

Masumi Saitoh, Reika Ichihara, M. Yamaguchi et al. · 2020 · 32 citations

Engineering, Electrical Engineering, Materials Science +16