Alan Myers

Mass and energy resolved detection of ions and neutral sputtered species incident at the substrate during reactive magnetron sputtering of Ti in mixed Ar+N2 mixtures

I. Petrov, Alan Myers, J. E. Greene et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1994 · 195 citations

Natural Sciences, Materials Engineering, Materials Science +14

Thermal error modelling of machine tools based on ANFIS with fuzzy c-means clustering using a thermal imaging camera

Ali Abdulshahed, Andrew P. Longstaff, Simon Fletcher et al. · Applied Mathematical Modelling · 2014 · 170 citations · Full text

Engineering, Manufacturing Engineering, Mechanical Engineering +17

Efficient estimation by FEA of machine tool distortion due to environmental temperature perturbations

Naeem S. Mian, Simon Fletcher, Andrew P. Longstaff et al. · Precision Engineering · 2012 · 112 citations · Full text

Engineering, Manufacturing Engineering, Mechanical Engineering +17

Efficient thermal error prediction in a machine tool using finite element analysis

Naeem S. Mian, Simon Fletcher, Andrew P. Longstaff et al. · Measurement Science and Technology · 2011 · 56 citations

Engineering, Manufacturing Engineering, Mechanical Engineering +17

Fermi Surfaces of Gold and Silver from Ultrasonic Attenuation

R. W. Morse, Alan Myers, C.T. Walker · Physical Review Letters · 1960 · 43 citations

Natural Sciences, Materials Science, Physics +14