G. B. Picotto

Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing

Francesco Marinello, P.F. Bariani, A. Pasquini et al. · Measurement Science and Technology · 2007 · 28 citations

Engineering, Optical Testing, Mechanical Engineering +19

Comparison between the¹²⁷I₂Stabilized He-Ne Lasers at 633 nm and 612 nm of the BIPM and the IMGC

F. Bertinetto, P. Cordiale, G. B. Picotto et al. · IEEE Transactions on Instrumentation and Measurement · 1983 · 24 citations

Sub Xmlns, Optical Materials, Engineering +18

Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements

G. B. Picotto, S. Desogus, Š. Lányi et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 18 citations

Scanner Displacements, Capacitive Sensors, Engineering +19

The IMGC calibration setup for microdisplacement actuators

A. Sacconi, G. B. Picotto, W. Pasin · IEEE Transactions on Instrumentation and Measurement · 1999 · 16 citations

Engineering, Measurement, Optical Testing +18

STM carbon nanotube tips fabrication for critical dimension measurements

A. Pasquini, G. B. Picotto, Marco Pisani · Sensors and Actuators A Physical · 2005 · 15 citations

Materials Science, Engineering, Carbon-based Material +5