Eun‐Hee Cirlin

Influence of O+2 energy, flux, and fluence on the formation and growth of sputtering-induced ripple topography on silicon

John J. Vajo, Robert E. Doty, Eun‐Hee Cirlin · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1996 · 111 citations

Natural Sciences, Materials Science, Physics +13

Ion-induced topography, depth resolution, and ion yield during secondary ion mass spectrometry depth profiling of a GaAs/AlGaAs superlattice: Effects of sample rotation

Eun‐Hee Cirlin, John J. Vajo, Robert E. Doty et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1991 · 68 citations

Natural Sciences, Materials Engineering, Materials Science +15

Interlaboratory comparison of the depth resolution in sputter depth profiling of Ni/Cr multilayers with and without sample rotation using AES, XPS, and SIMS

S. Hofmann, A. Zalar, Eun‐Hee Cirlin et al. · Surface and Interface Analysis · 1993 · 63 citations

Natural Sciences, Materials Engineering, Materials Science +15

On the alteration of Allende chondrules and the formation of matrix

R. M. Housley, Eun‐Hee Cirlin · NASA Technical Reports Server (NASA) · 1983 · 50 citations

Natural Sciences, Earth Sciences, Geology +15

Theory of improved resolution in depth profiling with sample rotation

R. Mark Bradley, Eun‐Hee Cirlin · Applied Physics Letters · 1996 · 42 citations

Natural Sciences, Geology, Flow Visualization +10