S. Balakumar

GaAs metal-oxide-semiconductor device with HfO2∕TaN gate stack and thermal nitridation surface passivation

Fei Gao, S. J. Lee, D. Z. et al. · Applied Physics Letters · 2007 · 72 citations

Engineering, Electrical Engineering, Materials Science +17

Understanding the lattice composition directed in situ structural disorder for enhanced visible light photocatalytic activity in Bismuth iron niobate pyrochlore

R. Radha, Ravi Kumar Y., Rohith Vinod K. et al. · Applied Catalysis B: Environmental · 2017 · 49 citations

Natural Sciences, Materials Engineering, Materials Science +17

Fabrication Aspects of Germanium on Insulator from Sputtered Ge on Si-Substrates

S. Balakumar, M. M. Roy, B. Ramamurthy et al. · Electrochemical and Solid-State Letters · 2006 · 38 citations

Engineering, Electrical Engineering, Materials Science +17

Characterization of ELID grinding process for machining silicon wafers

Md. Mofizul Islam, A. Senthil Kumar, S. Balakumar et al. · Journal of Materials Processing Technology · 2007 · 35 citations

Engineering, Manufacturing Engineering, Materials Engineering +12

Characterization and performance of dielectric diffusion barriers for Cu metallization

Zhe Chen, K. Prasad, C.Y. Li et al. · Thin Solid Films · 2004 · 31 citations

Natural Sciences, Materials Engineering, Materials Science +14