Statistics
Publications
1
Citations
15
H-Index
1
Active since
2013
Affiliations
Ryo Arai is an author at National Institute of Advanced Industrial Science and Technology specializing in device characterization, semiconductor materials, and integrated circuit devices.
Publications per year
2013–2013
1
1
(Invited) SiC MOS Interface States: Difference between Si Face and C Face
T. Umeda, Mitsuo Okamoto, Ryouji Kosugi et al. · ECS Transactions · 2013 · 15 citations
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