Ezra Bussmann - Concepedia

Author

Ezra Bussmann

Also Known As

Andrew Baczewski, Bussman, E., Bussmann, E., Bussmann, Ezra, Bussmann, Ezra; Koepke, Justin; Pena, Luis, Bussmann, Ezra; Muller, Richard P.; Scrymgeour, David; Carroll, Malcolm S.; Koepke, Justin, Bussmann, Ezra; Ohta, Taisuke; Scrymgeour, David; Brumbach, Michael T.; Smith, Sean; Hjalmarson, Harold P.; Schultz, Peter Andrew; Clem, Paul G.; Hopkins, Matthew M.; Moore, Christopher Hudson; Berg, Morgann, E Bussmann, E. B. Bussmann, E. Bussmann

137

Publications

756

Citations

H-Index

Concepts

All Affiliations

Sandia National Laboratories Aix-Marseille Université Centre Interdisciplinaire de Nanoscience de Marseille Centre National de la Recherche Scientifique University of Utah

About

Ezra Bussmann is an author at Sandia National Laboratories specializing in applied physics, engineering, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	17	451
2	Applied Physics	14	17	451
3	Natural Sciences	3	3	49
4	Chemistry	2	2	31
5	Chemical Engineering	1	1	13

Ezra Bussmann

Publications

583

Citations

H-Index

Page 1

	Year	Citations
Dynamics of solid thin-film dewetting in the silicon-on-insulator system Ezra Bussmann, Fabien Cheynis, Frédéric Leroy, New Journal of Physics EngineeringSilicon On InsulatorSio2 SubstratesNanoscale ModelingNanoscale Science	2011	69
Dewetting dynamics of silicon-on-insulator thin films Fabien Cheynis, Ezra Bussmann, Frédéric Leroy, Physical Review B EngineeringThin Film Process TechnologySilicon On InsulatorNanoelectronicsNanoscale Modeling	2011	65
Sub-10 nm lateral spatial resolution in scanning capacitance microscopy achieved with solid platinum probes Ezra Bussmann, C. C. Williams Review of Scientific Instruments EngineeringMicroscopyIntegrated CircuitsSilicon On InsulatorSemiconductor Device	2004	47
Single-electron tunneling force spectroscopy of an individual electronic state in a nonconducting surface Ezra Bussmann, C. C. Williams Applied Physics Letters Categoryquantum ElectronicsEngineeringElectron DiffractionCharge TransportElectronic Structure	2006	32
Atomic-precision advanced manufacturing for Si quantum computing Ezra Bussmann, Robert Butera, James H. G. Owen, MRS Bulletin	2021	32
Single-electron tunneling to insulator surfaces measured by frequency detection electrostatic force microscopy Ezra Bussmann, Dong Jun Kim, C. C. Williams Applied Physics Letters EngineeringTunneling MicroscopyPhysicsMicroscopyElectron Microscopy	2004	27
Impact of Incorporation Kinetics on Device Fabrication with Atomic Precision Jeffrey Ivie, Quinn Campbell, Justin Koepke, Physical Review Applied EngineeringTarget FabricationNanocomputingMolecular DynamicsSemiconductor Nanostructures	2021	26
Scanning capacitance microscopy registration of buried atomic-precision donor devices Ezra Bussmann, M. S. Rudolph, Ganapathi Subramania, Nanotechnology EngineeringMicroscopyCapacitance MicroscopeCapacitance Microscopy RegistrationDonor Nanostructures	2015	23
Modeling Si/SiGe quantum dot variability induced by interface disorder reconstructed from multiperspective microscopy Luis Fabián Peña, Justine Koepke, J. Houston Dycus, npj Quantum Information	2024	22
AlCl<sub>3</sub>-Dosed Si(100)-2 × 1: Adsorbates, Chlorinated Al Chains, and Incorporated Al Matthew S. Radue, Sung-Ha Baek, Azadeh Farzaneh, The Journal of Physical Chemistry C	2021	21

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