Concepedia

U Elisa

UE

2

Publications

148

Citations

2

H-Index

1998

Active since

Affiliations

Texas Instruments (United States)(Current)

U Elisa is an author at Texas Instruments (United States) specializing in engineering, microscopy, and dimensional metrology.

Top concepts

Publications per year

1998–1998

2

Publications

2

Scanning capacitance spectroscopy: An analytical technique for pn-junction delineation in Si devices

Hal Edwards, Rudye McGlothlin, Richard San Martin et al. · Applied Physics Letters · 1998 · 116 citations

, , +16

Vertical metrology using scanning-probe microscopes: Imaging distortions and measurement repeatability

Hal Edwards, Rudye McGlothlin, U Elisa · Journal of Applied Physics · 1998 · 32 citations

, , +23

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