R. S. Sillmon

Modulation spectroscopy as a tool for electronic material characterization

N. Bottka, D. Kurt Gaskill, R. S. Sillmon et al. · Journal of Electronic Materials · 1988 · 148 citations

Materials Science, Engineering, Electronic Materials +7

In situ, real-time diagnostics of OMVPE using IR-diode laser spectroscopy

J. E. Butler, N. Bottka, R. S. Sillmon et al. · Journal of Crystal Growth · 1986 · 126 citations

Engineering, Real-time Diagnostics, Infrared Sensor +8

IR diode laser probing of OMVPE kinetics

D. Kurt Gaskill, Vassily Kolubayev, N. Bottka et al. · Journal of Crystal Growth · 1988 · 39 citations

Engineering, Laser-induced Breakdown, Spectroscopy +3

Photoreflectance surface Fermi level measurements of GaAs subjected to various chemical treatments

D. Kurt Gaskill, N. Bottka, R. S. Sillmon · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1988 · 38 citations

Optical Materials, Engineering, Contactless Form Photoreflectance +24

An ultra-fast gas delivery system for producing abrupt compositional switching in OMVPE

R. S. Sillmon, N. Bottka, J. E. Butler et al. · Journal of Crystal Growth · 1986 · 22 citations

Abrupt Compositional Switching, Electrical Engineering, Engineering