David Weyburne

Correlation between optoelectronic and structural properties and epilayer thickness of AlN

B. N. Pantha, R. Dahal, M. L. Nakarmi et al. · Applied Physics Letters · 2007 · 146 citations · Full text

Aluminium Nitride, Optical Materials, Engineering +18

Inversion domains in AlN grown on (0001) sapphire

Jacek B. Jasiński, Z. Liliental‐Weber, Qing Paduano et al. · Applied Physics Letters · 2003 · 115 citations · Full text

Materials Science, Aluminium Nitride, Engineering +13

Optical parametric generation of a mid-infrared continuum in orientation-patterned GaAs

Paulina S. Kuo, Konstantin L. Vodopyanov, M. M. Fejer et al. · Optics Letters · 2006 · 105 citations

External Conversion Efficiency, Optical Materials, Engineering +16

Flow visualization studies for optimization of OMVPE reactor design

C.A. Wang, S. H. Groves, S. C. Palmateer et al. · Journal of Crystal Growth · 1986 · 91 citations

Engineering, Computer-aided Engineering, Process Engineering +4

Effect of initial process conditions on the structural properties of AlN films

Qing Paduano, David Weyburne, Jacek B. Jasiński et al. · Journal of Crystal Growth · 2003 · 80 citations

Materials Engineering, Materials Science, Initial Process Conditions +11