J. Servat

Nanometer-scale oxidation of Si(100) surfaces by tapping mode atomic force microscopy

Francesc Pérez‐Murano, G. Abadal, N. Barniol et al. · Journal of Applied Physics · 1995 · 82 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

High-vacuum versus ‘‘environmental’’ electron beam deposition

Albert Folch, J. Servat, J. Esteve et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 62 citations

Natural Sciences, Materials Engineering, Materials Science +12

Nanotribological Properties of Octadecyltrichlorosilane Self-Assembled Ultrathin Films Studied by Atomic Force Microscopy:  Contact and Tapping Modes

M.F. Garcia Parajo, Claudia Longo, J. Servat et al. · Langmuir · 1997 · 53 citations

Natural Sciences, Materials Engineering, Materials Science +17

Atomic Force Microscopy Study of the Silicon Doping Influence on the First Stages of Platinum Electroless Deposition

Pau Gorostiza, J. Servat, Fausto Sanz et al. · Journal of The Electrochemical Society · 1997 · 50 citations

Natural Sciences, Materials Engineering, Materials Science +17

First stages of platinum electroless deposition on silicon (100) from hydrogen fluoride solutions studied by AFM

Pau Gorostiza, J. Servat, J.R. Morante et al. · Thin Solid Films · 1996 · 45 citations

Natural Sciences, Materials Engineering, Materials Science +11