W. Shedd

The Impact of Total Ionizing Dose on Unhardened SRAM Cell Margins

Xiaoyin Yao, Nathan D. Hindman, Lawrence T. Clark et al. · IEEE Transactions on Nuclear Science · 2008 · 41 citations

Total Ionizing Dose, Engineering, Large Sram +20

Electronic structure theory and mechanisms of the oxide trapped hole annealing process

Shashi P. Karna, Andrew C. Pineda, R.D. Pugh et al. · IEEE Transactions on Nuclear Science · 2000 · 34 citations

Engineering, Chemistry, Electronic Structure +18

Dose Rate Upset Investigations on the Xilinx Virtex IV Field Programmable Gate Arrays

Alonzo Vera, Daniel Llamocca, Marios S. Pattichis et al. · 2007 · 27 citations

Engineering, Radiation Exposure, Dose Rate +19

Radiation induced charge trapping at the silicon sapphire substrate interface

D. Neamen, W. Shedd, B. Buchanan · IEEE Transactions on Nuclear Science · 1974 · 26 citations

Total Ionizing, Electrical Engineering, Silicon Sapphire Interface +13

The effect of near-interface network strain on proton trapping in SiO/sub 2/

K. Vanheusden, Prakashan Korambath, Henry A. Kurtz et al. · IEEE Transactions on Nuclear Science · 1999 · 24 citations

Engineering, Chemistry, Silicon On Insulator +19