H. Konuk

Fastpath: a path-delay test generator for standard scan designs

B. Underwood, Wai-On Law, Sungho Kang et al. · 1994 · 67 citations

Engineering, Computer Architecture, Software Analysis +18

Voltage- and current-based fault simulation for interconnect open defects

H. Konuk · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1999 · 42 citations

Engineering, Vlsi Design, Computer Architecture +17

An unexpected factor in testing for CMOS opens: the die surface

H. Konuk, F.J. Ferguson · 2002 · 36 citations

Engineering, Vlsi Design, Computer Architecture +19

Explorations of sequential ATPG using Boolean satisfiability

H. Konuk, T. Larrabee · 2002 · 33 citations

Engineering, Verification, Test Data Generation +16

Oscillation and sequential behavior caused by interconnect opens in digital CMOS circuits

H. Konuk, F.J. Ferguson · 2002 · 28 citations

Sequential Behavior, Engineering, Vlsi Design +11