Guangze Pan

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Active since

2020

Affiliations

China Electronic Product Reliability and Environmental Test Institute(Current)

Guangze Pan is an author at China Electronic Product Reliability and Environmental Test Institute specializing in reliability modeling, industrial engineering, and reliability.

ORCID

Publications per year

2020–2023

Publications

A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula function

Guangze Pan, Yaqiu Li, Xiaobing Li et al. · Microelectronics Reliability · 2020 · 28 citations

Engineering, Industrial Engineering, Systems Engineering +13

A reliability analysis method based on the mixed correlated competition model considering multi-performance degradation and sudden failures

Guangze Pan, Guangkuo Guo, Dan Li et al. · Engineering Failure Analysis · 2023 · 18 citations

Engineering, Industrial Engineering, Systems Engineering +17

A reliability evaluation method of complex electromechanical products based on the multi-stress coupling acceleration model

Guangze Pan, Xiaojian Ding, Dan Li et al. · Engineering Failure Analysis · 2023 · 16 citations

Engineering, Electrical Engineering, Mechanical Engineering +11

A novel accelerated life-test method under thermal cyclic loadings for electronic devices considering multiple failure mechanisms

Yaqiu Li, Guangze Pan, Qian Li et al. · Microelectronics Reliability · 2020 · 12 citations

Engineering, Electrical Engineering, Materials Engineering +17

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