D.V. Sulway

The direct observation of electrical leakage paths due to crystal defects by use of the scanning electron microscope

Iwan Davies, K.A. Hughes, D.V. Sulway et al. · Solid-State Electronics · 1966 · 23 citations

Materials Engineering, Electrical Engineering, Engineering +13

Scanning electron microscopy in device diagnostics and reliability physics

P. R. Thornton, D.V. Sulway, David Shaw · IEEE Transactions on Electron Devices · 1969 · 21 citations

Engineering, Microscopy, Thermal Hot Spots +16

Application of Secondary-Electron Channel Multipliers to Scanning Electron Microscopy

K.A. Hughes, D.V. Sulway, R. Wayte et al. · Journal of Applied Physics · 1967 · 16 citations

Electron Microscopy, Physics, Microscopy +4

The detection of current filaments in VO2 thin-film switches using the scanning electron microscope

Robert Philippe. Beaulieu, D.V. Sulway, C. D. W. Cox · Solid-State Electronics · 1973 · 15 citations

Materials Science, Engineering, Microscopy +7

Crystal mosaic structures and the lasing properties of GaAs laser diodes

David Shaw, K.A. Hughes, N.F.B. Neve et al. · Solid-State Electronics · 1966 · 10 citations

Photonics, Gaas Laser Diodes, Optical Materials +12