S. Fisson

Temperature dependence of the dielectric function of silicon using in situ spectroscopic ellipsometry

G. Vuye, S. Fisson, Vien Van et al. · Thin Solid Films · 1993 · 158 citations

Dielectric Function, Electrical Engineering, Engineering +10

Determination of pore size distribution in thin organized mesoporous silica films by spectroscopic ellipsometry in the visible and infrared range

A. Bourgeois, Awen Bruneau, S. Fisson et al. · Thin Solid Films · 2004 · 40 citations

Materials Science, Pore Size Distribution, Chemical Engineering +11

Change of TO and LO mode frequency of evaporated SiO2 films during aging in air

A. Brunet‐Bruneau, S. Fisson, G. Vuye et al. · Journal of Applied Physics · 2000 · 39 citations

Optical Materials, Engineering, Nanoporous Material +21

Initial stages in the formation of PtSi on Si(111) as followed by photoemission and spectroscopic ellipsometry

L. Ley, Y. Wang, Vien Van et al. · Thin Solid Films · 1995 · 39 citations

Ii-vi Semiconductor, Engineering, Physics +12

SiO 2 – TiO 2 interfaces studied by ellipsometry and x-ray photoemission spectroscopy

Bruno Gallas, A. Brunet‐Bruneau, S. Fisson et al. · Journal of Applied Physics · 2002 · 33 citations

Materials Science, Sio 2, Surface Characterization +15