V. Zajic

Secondary-electron yields and their dependence on the angle of incidence on stainless-steel surfaces for three energetic ion beams

P. Thieberger, A.L. Hanson, D. Steski et al. · Physical Review A · 2000 · 41 citations

Natural Sciences, Materials Science, Radiation Physics +11

Heavy ion linear energy transfer measurements during single event upset testing of electronic devices

V. Zajic, P. Thieberger · IEEE Transactions on Nuclear Science · 1999 · 38 citations

Natural Sciences, Nuclear Engineering, Physics +12

Test EBIS operation and component development for the RHIC EBIS*

E. Beebe, J. Alessi, D. A. Graham et al. · Journal of Physics Conference Series · 2004 · 15 citations · Full text

Engineering, Nuclear Engineering, Physics +14

Heavy-ion beams for single-event research at Brookhaven — present and future

P. Thieberger, E. G. Stassinopoulos, O. Van Gunten et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1991 · 12 citations

Natural Sciences, Nuclear Engineering, Physics +11