I.L. Somos

Power semiconductors empirical diagrams expressing life as a function of temperature excursion

I.L. Somos, D.E. Piccone, L.J. Willinger et al. · IEEE Transactions on Magnetics · 1993 · 34 citations

Engineering, Temperature Excursion, Thermal Energy +21

Plasma spread in high-power thyristors under dynamic and static conditions

I.L. Somos, D.E. Piccone · IEEE Transactions on Electron Devices · 1970 · 30 citations

Infrared Viewing Technique, Electrical Engineering, Plasma Electronics +11

Behavior of thyristors under transient conditions

I.L. Somos, D.E. Piccone · Proceedings of the IEEE · 1967 · 20 citations

Device Modeling, Electrical Engineering, Engineering +13

Power semiconductors-a new method for predicting the on-state characteristic and temperature rise during multicycle fault currents

I.L. Somos, D.E. Piccone, L.J. Willinger et al. · IEEE Transactions on Industry Applications · 1995 · 16 citations

Engineering, Mm Thyristors, Power Electronics +20

A thermal analogue of higher accuracy and factory test method for predicting and supporting thyristor fault suppression ratings

D.E. Piccone, L.O. Eriksson, J. Urbanek et al. · Conference Record of the 1988 IEEE Industry Applications Society Annual Meeting · 2003 · 15 citations

Fault Diagnosis, Engineering, Power Electronic Systems +23