Bruce W. Krakauer

Absolute atomic-scale measurements of the Gibbsian interfacial excess of solute at internal interfaces

Bruce W. Krakauer, David N. Seidman · Physical review. B, Condensed matter · 1993 · 229 citations

Engineering, Microscopy, Gibbsian Interfacial Excess +23

Systematic procedures for atom-probe field-ion microscopy studies of grain boundary segregation

Bruce W. Krakauer, D. N. Seidman · Review of Scientific Instruments · 1992 · 96 citations

Magnetic Properties, Transmission Electron, Engineering +19

Subnanometer scale study of segregation at grain boundaries in an Fe(Si) alloy

Bruce W. Krakauer, D.N. Seidman · Acta Materialia · 1998 · 89 citations

Materials Science, Materials Engineering, Grain Boundaries +11

A system for systematically preparing atom-probe field-ion-microscope specimens for the study of internal interfaces

Bruce W. Krakauer, Juanrui Hu, S.-M. Kuo et al. · Review of Scientific Instruments · 1990 · 85 citations

Engineering, Microscopy, High Voltage Electrical Fields +20

Atomic scale studies of solute-atom segregation at grain boundaries: Experiments and simulations

David N. Seidman, Bruce W. Krakauer, D. Udler · Journal of Physics and Chemistry of Solids · 1994 · 66 citations

Atomic Scale Studies, Grain Boundaries, Engineering +13