Concepedia

M. O. Aboelfotoh

MO

57

Publications

1.9K

Citations

26

H-Index

1972

Active since

Affiliations

IBM Research - Thomas J. Watson Research Center(Current)

North Carolina State University

IBM (United States)

KTH Royal Institute of Technology

King Fahd University of Petroleum and Minerals

M. O. Aboelfotoh is an author at IBM Research - Thomas J. Watson Research Center specializing in applied physics, engineering, and materials science.

Top concepts

EngineeringApplied PhysicsMaterial ScienceElectrical EngineeringThin FilmsSurface ScienceSemiconductorsCrystalline DefectsMaterials EngineeringPhysics

Publications per year

1972–2014

57

Publications

57

Formation, oxidation, electronic, and electrical properties of copper silicides

A. Cros, M. O. Aboelfotoh, K. N. Tu · Journal of Applied Physics · 1990 · 203 citations

Materials Engineering, Semiconductors, Materials Science +15

Influence of secondary-electron emission from MgO surfaces on voltage-breakdown curves in Penning mixtures for insulated-electrode discharges

M. O. Aboelfotoh, J. Lorenzen · Journal of Applied Physics · 1977 · 92 citations

Mgo Surfaces, Engineering, Glow Discharge +17

Unusually low resistivity of copper germanide thin films formed at low temperatures

L. Krusin‐Elbaum, M. O. Aboelfotoh · Applied Physics Letters · 1991 · 82 citations

Materials Science, Electrical Engineering, Low Temperatures +15

Temperature dependence of the Schottky-barrier height of tungsten on n-type and p-type silicon

M. O. Aboelfotoh · Solid-State Electronics · 1991 · 78 citations

Materials Science, Semiconductor Device, Engineering +6

Schottky-barrier behavior of copper and copper silicide on<i>n</i>-type and<i>p</i>-type silicon

M. O. Aboelfotoh, A. Cros, Bengt Svensson et al. · Physical review. B, Condensed matter · 1990 · 78 citations

Materials Science, Semiconductors, Electrical Engineering +11

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