Concepedia

Author

Yefan Liu

Institute of MicroelectronicsORCID

Also Known As

Liu YeFan, Ye-Fan Liu, Yefan Liu

20

Publications

354

Citations

9

H-Index

16

Concepts

All Affiliations

Institute of MicroelectronicsPeking UniversityIMECNanjing University of Science and Technology
YL

About

Yefan Liu is an author at Institute of Microelectronics specializing in engineering, electrical engineering, and polymer chemistry.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

2

2

25

2

Electrical Engineering

2

2

25

3

Applied Physics

1

1

14

4

Materials Science

1

1

11

5

Microelectronics

1

1

14

Yefan Liu

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9

Publications

329

Citations

9

H-Index

YearCitations

Novel Vertical 3D Structure of TaOx-based RRAM with Self-localized Switching Region by Sidewall Electrode Oxidation

Muxi Yu, Yimao Cai, Zongwei Wang,

Scientific Reports

2016

95

A flexible organic resistance memory device for wearable biomedical applications

Yimao Cai, Jing Tan, Yefan Liu,

Nanotechnology

2016

93

Light‐Tunable Nonvolatile Memory Characteristics in Photochromic RRAM

Haifeng Ling, Kangming Tan, Qiyun Fang,

Advanced Electronic Materials

2017

54

Heterogeneous Fe-Doped NiCoP–MoO<sub>3</sub> Efficient Electrocatalysts for Overall Water Splitting

Fengye Guo, Wenhua Li, Yefan Liu,

Langmuir

2023

24

In-situ construction defect-rich CuNiCoS4 /1T-MoS2 heterostructures as superior electrocatalysts for water splitting

Jiaying Shen, Yefan Liu, Qianqiao Chen,

Journal of Colloid and Interface Science

2023

18

Electrical Characterization of BEOL Plasma-Induced Damage in Bulk FinFET Technology

Gaspard Hiblot, A. Subirats, Yefan Liu,

IEEE Transactions on Device and Materials Reliability

2018

14

Resistive switching in organic memory devices for flexible applications

Ru Huang, Yimao Cai, Yefan Liu,

2014

11

Microscopic origin of read current noise in TaOx-based resistive switching memory by ultra-low temperature measurement

Yue Pan, Yimao Cai, Yefan Liu,

Applied Physics Letters

2016

10

Investigation of the Impact of Externally Applied Out-of-Plane Stress on Ferroelectric FET

Yefan Liu, Sergiu Clima, Gaspard Hiblot,

IEEE Electron Device Letters

2021

10

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