Concepedia

J. Zalnoski

JZ

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Publications

1

Citations

33

H-Index

1

Active since

1997

J. Zalnoski is an author specializing in kill rates, engineering, and process yield.

Publications per year

1997–1997

1

Publications

1

Limited yield estimation for visual defect sources

Phyllis J. Mullenix, J. Zalnoski, Arne Kasten · IEEE Transactions on Semiconductor Manufacturing · 1997 · 33 citations

Engineering, Computer Engineering, Computer Vision +11

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