F. Simondet

Combined RHEED-AES study of the thermal treatment of (001) GaAs surface prior to MBE growth

G. Laurence, F. Simondet, P. Saget · Applied Physics A · 1979 · 46 citations

Materials Engineering, Electrical Engineering, Engineering +8

Investigations into the direct analysis of semiconductor grade gases by inductively coupled plasma mass spectrometry

Robert C. Hutton, Martine Bridenne, E. Coffre et al. · Journal of Analytical Atomic Spectrometry · 1990 · 31 citations

Engineering, Direct Analysis, Chemistry +18

Nondestructive analysis of Si3N4/SiO2/Si structures using spectroscopic ellipsometry

J. B. Theeten, D. E. Aspnes, F. Simondet et al. · Journal of Applied Physics · 1981 · 29 citations

Materials Science, Materials Engineering, Electrical Engineering +13

<i>I</i> <i>n</i> <i>s</i> <i>i</i> <i>t</i> <i>u</i> monitoring by ellipsometry of metalorganic epitaxy of GaAlAs-GaAs superlattice

F. Hottier, J. Hallais, F. Simondet · Journal of Applied Physics · 1980 · 25 citations

Wide-bandgap Semiconductor, Engineering, Gaas-gaalas Superlattices +16

A comparative study of SIMS depth profiling of boron in silicon

J. B. Clegg, A. E. Morgan, H. A. M. de Grefte et al. · Surface and Interface Analysis · 1984 · 24 citations

Boron Profile, Engineering, Microscopy +20