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Vasily V. Orlov

VV

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Publications

3

Citations

45

H-Index

3

Active since

2016

Affiliations

National Research Nuclear University MEPhI(Current)

Vasily V. Orlov is an author at National Research Nuclear University MEPhI specializing in electrical engineering, device modeling, and microelectronics.

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Publications per year

2016–2018

3

Publications

3

Physics-based modeling of TID induced global static leakage in different CMOS circuits

Gennady I. Zebrev, Vasily V. Orlov, Maxim S. Gorbunov et al. · Microelectronics Reliability · 2018 · 18 citations

, , +11

Compact Modeling of MOSFET I-V Characteristics and Simulation of Dose-Dependent Drain Currents

Gennady I. Zebrev, Vasily V. Orlov, Alexander S. Bakerenkov et al. · IEEE Transactions on Nuclear Science · 2017 · 16 citations

, , +15

Compact modeling of I-V characteristics in irradiated MOSFETs: Impact of operation temperature and interface traps

Vasily V. Orlov, Vladislav A. Felitsyn, Gennady I. Zebrev · 2016 · 11 citations

, , +13

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