Erik Bodegom

<title>Temperature dependence of dark current in a CCD</title>

Ralf Widenhorn, Morley M. Blouke, A. Weber et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2002 · 104 citations

Activation Energy, Electrical Engineering, Semiconductor Device +15

The Meyer–Neldel rule for a property determined by two transport mechanisms

Ralf Widenhorn, A. Rest, Erik Bodegom · Journal of Applied Physics · 2002 · 50 citations

Engineering, Experimental Thermodynamics, Mathematical Statistical Physic +22

Meyer–Neldel rule for dark current in charge-coupled devices

Ralf Widenhorn, Lars Mündermann, A. Rest et al. · Journal of Applied Physics · 2001 · 42 citations

Device Modeling, Electrical Engineering, Electronic Devices +9

Dark current measurements in a CMOS imager

William C. Porter, Bradley Kopp, Justin C. Dunlap et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2008 · 36 citations

Event Camera, Electrical Engineering, Engineering +11

Exposure Time Dependence of Dark Current in CCD Imagers

Ralf Widenhorn, Justin C. Dunlap, Erik Bodegom · IEEE Transactions on Electron Devices · 2010 · 30 citations

Dark Current Generation, Electrical Engineering, Engineering +9