1
Publications
23
Citations
1
H-Index
2018
Active since
Affiliations
National Institute of Metrology(Current)
Lanruo Wang is an author at National Institute of Metrology specializing in materials engineering, microelectronics, and mechanical properties.
Top concepts
Thin FilmsEngineeringApplied PhysicsMaterial ScienceMicroelectronicsSuperconductivityMaterials EngineeringMechanical PropertiesNiobium-based Superconductors
Publications per year
2018–2018
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